Influence of flag leaf area on wheat adaptation on stress condition

Abstract

The leaf area plays main importance for photosynthesis and for obtaining high grain yield. The leaf area duration (LAD) and leaf area index (LAI), directly affect dry matter synthesis and grain yield and consequently tolerance to stress conditions. In diallel crosses (4 x 4) without reciprocals of divergent wheat cultivars (Jugoslavia, Zitnica, NS Rana 2, Osijecanka) in F₁ and F₂ hybrids significant differences were found for the examined characters. The flag leaf area in F₁ and F₂ generation was inherited intermediately, partially dominantly or dominantly depending on the combination. The analysis of variance for both general (GCA) and specific (SCA) combining ability showed that flag lef area controled by genes with additive and non-additive effect. The highest positive value of GCA in both F₁ and F₂ hybrids was shown Zitnica cultivar. The best F₁ hybrid combination were, Zitnica x NS Rana 2 and NS Rana 2 x Osijecanka and F₂ generation the best combination was Jugoslavija x NS Rana 2.